Effects of O3 and H2O oxidants on C and N-related impurities in atomic-layer-deposited La2O3 films observed by in situ x-ray photoelectron spectroscopy

Title
Effects of O3 and H2O oxidants on C and N-related impurities in atomic-layer-deposited La2O3 films observed by in situ x-ray photoelectron spectroscopy
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 97, Issue 9, Pages 092904
Publisher
AIP Publishing
Online
2010-09-02
DOI
10.1063/1.3481377

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