Highly Stable Ultrathin TiO2Based Resistive Random Access Memory with Low Operation Voltage
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Title
Highly Stable Ultrathin TiO2Based Resistive Random Access Memory with Low Operation Voltage
Authors
Keywords
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Journal
ECS Journal of Solid State Science and Technology
Volume 7, Issue 7, Pages Q3183-Q3188
Publisher
The Electrochemical Society
Online
2018-05-15
DOI
10.1149/2.0281807jss
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