Development of an improved Kelvin probe force microscope for accurate local potential measurements on biased electronic devices
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Title
Development of an improved Kelvin probe force microscope for accurate local potential measurements on biased electronic devices
Authors
Keywords
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Journal
JOURNAL OF MICROSCOPY
Volume 267, Issue 3, Pages 272-279
Publisher
Wiley
Online
2017-04-10
DOI
10.1111/jmi.12563
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