A scanning Kelvin probe study of charge trapping in zone-cast pentacene thin film transistors

Title
A scanning Kelvin probe study of charge trapping in zone-cast pentacene thin film transistors
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 20, Issue 2, Pages 025203
Publisher
IOP Publishing
Online
2008-12-10
DOI
10.1088/0957-4484/20/2/025203

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