Single-pass Kelvin force microscopy and dC/dZmeasurements in the intermittent contact: applications to polymer materials

Title
Single-pass Kelvin force microscopy and dC/dZmeasurements in the intermittent contact: applications to polymer materials
Authors
Keywords
-
Journal
Beilstein Journal of Nanotechnology
Volume 2, Issue -, Pages 15-27
Publisher
Beilstein Institut
Online
2011-01-06
DOI
10.3762/bjnano.2.2

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now