Practical aspects of single-pass scan Kelvin probe force microscopy
Published 2012 View Full Article
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Title
Practical aspects of single-pass scan Kelvin probe force microscopy
Authors
Keywords
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Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 83, Issue 11, Pages 113701
Publisher
AIP Publishing
Online
2012-11-07
DOI
10.1063/1.4761922
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