Characterization at the nanometer scale of local electron beam irradiation of CNT based devices

Published 2007 View Full Article

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Title
Characterization at the nanometer scale of local electron beam irradiation of CNT based devices
Authors
Keywords
-
Journal
MICROELECTRONIC ENGINEERING
Volume 85, Issue 5-6, Pages 1413-1416
Publisher
Elsevier BV
Online
2007-12-28
DOI
10.1016/j.mee.2007.12.014

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