Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping Layers

Nanoscale Measurement of Laser-Induced Temperature Rise and Field Evaporation Effects in CdTe and GaN

(2015) David R. Diercks et al.   Journal of Physical Chemistry C

Controlled activation of ZnTe:Cu contacted CdTe solar cells using rapid thermal processing

(2015) Jiaojiao Li et al.   SOLAR ENERGY MATERIALS AND SOLAR CELLS

Applicability of post-ionization theory to laser-assisted field evaporation of magnetite

(2014) D. K. Schreiber et al.   APPLIED PHYSICS LETTERS

Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field

(2014) Lorenzo Mancini et al.   Journal of Physical Chemistry C

Study of vertical Si/SiO2 interface using laser-assisted atom probe tomography and transmission electron microscopy

(2013) J.H. Lee et al.   MICRON

Electrostatic simulations of a local electrode atom probe: The dependence of tomographic reconstruction parameters on specimen and microscope geometry

(2012) Shyeh Tjing Loi et al.   ULTRAMICROSCOPY

Non-Tangential Continuity Reconstruction in Atom Probe Tomography Data

(2011) D Larson et al.   MICROSCOPY AND MICROANALYSIS

Directed 2D-to-3D Pattern Transfer Method for Controlled Fabrication of Topologically Complex 3D Features in Silicon

(2010) Konrad Rykaczewski et al.   ADVANCED MATERIALS

Evolution of tip shape during field evaporation of complex multilayer structures

(2010) E. A. MARQUIS et al.   JOURNAL OF MICROSCOPY

Electron beam induced deposition at elevated temperatures: compositional changes and purity improvement

(2010) J J L Mulders et al.   NANOTECHNOLOGY

Fe:O:C grown by focused-electron-beam-induced deposition: magnetic and electric properties

(2010) R Lavrijsen et al.   NANOTECHNOLOGY

Investigation of the analysis parameters and background subtraction for high-k materials with atom probe tomography

(2010) S. Mutas et al.   ULTRAMICROSCOPY

Quantitative atom probe analysis of carbides

(2010) M. Thuvander et al.   ULTRAMICROSCOPY

Si nanoparticles in SiO2An atomic scale observation for optimization of optical devices

(2009) E. Talbot et al.   EPL

Magnetotransport properties of high-quality cobalt nanowires grown by focused-electron-beam-induced deposition

(2009) A Fernández-Pacheco et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

High-purity cobalt nanostructures grown by focused-electron-beam-induced deposition at low current

(2009) R. Córdoba et al.   MICROELECTRONIC ENGINEERING

Gas-assisted focused electron beam and ion beam processing and fabrication

(2008) Ivo Utke et al.   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B

3-D analysis of semiconductor dopant distributions in a patterned structure using LEAP

(2007) J.S. Moore et al.   ULTRAMICROSCOPY