In Situ Sputtering From the Micromanipulator to Enable Cryogenic Preparation of Specimens for Atom Probe Tomography by Focused-Ion Beam
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Title
In Situ Sputtering From the Micromanipulator to Enable Cryogenic Preparation of Specimens for Atom Probe Tomography by Focused-Ion Beam
Authors
Keywords
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Journal
MICROSCOPY AND MICROANALYSIS
Volume 29, Issue 3, Pages 1009-1017
Publisher
Oxford University Press (OUP)
Online
2023-04-05
DOI
10.1093/micmic/ozad020
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