Journal
MATERIALS CHARACTERIZATION
Volume 178, Issue -, Pages -Publisher
ELSEVIER SCIENCE INC
DOI: 10.1016/j.matchar.2021.111194
Keywords
Al-Mg-Si-Cu alloy; Xe plasma focussed ion beam; Atom probe tomography; Dispersoid
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Funding
- Constellium
- UK Engineering and Physical Science Research Council (EPSRC) [LEAP 5000XR, EP/M022803/1]
- Henry Royce Institute (through EPSRC) [EP/R010145/1]
- Engineering and Physical Sciences Research Council [EP/S021663/1] Funding Source: researchfish
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The use of a Xe plasma Focussed Ion Beam instrument in preparing in-situ specimens for Atom Probe Tomography is found to show no significant differences in the nature and distribution of precipitates and solute clusters compared to standard electropolishing methods. Site-specific specimen preparation also enables the observation of segregation in both the phase boundary and shell of the dispersoid in an alpha-Al(Fe,Mn)Si dispersoid.
A Xe plasma Focussed Ion Beam instrument was used to prepare in-situ specimens for Atom Probe Tomography from a bulk sample of an aluminium 6XXX alloy. The nature and distribution of precipitates and solute clusters observed in the alloy are not observed to differ between standard electropolishing methods and Xe plasma preparation. Enabled by site specific specimen preparation, analysis of an alpha-Al(Fe,Mn)Si dispersoid shows segregation at the phase boundary and in the shell of the dispersoid.
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