Probing Electron Beam Induced Transformations on a Single-Defect Level via Automated Scanning Transmission Electron Microscopy

Title
Probing Electron Beam Induced Transformations on a Single-Defect Level via Automated Scanning Transmission Electron Microscopy
Authors
Keywords
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Journal
ACS Nano
Volume 16, Issue 10, Pages 17116-17127
Publisher
American Chemical Society (ACS)
Online
2022-10-08
DOI
10.1021/acsnano.2c07451

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