Probing Electron Beam Induced Transformations on a Single-Defect Level via Automated Scanning Transmission Electron Microscopy
出版年份 2022 全文链接
标题
Probing Electron Beam Induced Transformations on a Single-Defect Level via Automated Scanning Transmission Electron Microscopy
作者
关键词
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出版物
ACS Nano
Volume 16, Issue 10, Pages 17116-17127
出版商
American Chemical Society (ACS)
发表日期
2022-10-08
DOI
10.1021/acsnano.2c07451
参考文献
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