Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene
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Title
Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene
Authors
Keywords
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Journal
PHYSICAL REVIEW LETTERS
Volume 108, Issue 19, Pages -
Publisher
American Physical Society (APS)
Online
2012-05-08
DOI
10.1103/physrevlett.108.196102
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