Influence of Thermal Annealing Treatment on Bipolar Switching Properties of Vanadium Oxide Thin-Film Resistance Random-Access Memory Devices

Title
Influence of Thermal Annealing Treatment on Bipolar Switching Properties of Vanadium Oxide Thin-Film Resistance Random-Access Memory Devices
Authors
Keywords
Thermal annealing process, bipolar switching properties, vanadium oxide, thin film, RRAM, RTA
Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 46, Issue 4, Pages 2147-2152
Publisher
Springer Nature
Online
2016-12-02
DOI
10.1007/s11664-016-5148-3

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