A kinetic model for stress generation in thin films grown from energetic vapor fluxes
Published 2016 View Full Article
- Home
- Publications
- Publication Search
- Publication Details
Title
A kinetic model for stress generation in thin films grown from energetic vapor fluxes
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 119, Issue 14, Pages 145307
Publisher
AIP Publishing
Online
2016-04-14
DOI
10.1063/1.4946039
References
Ask authors/readers for more resources
Related references
Note: Only part of the references are listed.- Compressive intrinsic stress originates in the grain boundaries of dense refractory polycrystalline thin films
- (2016) D. Magnfält et al. JOURNAL OF APPLIED PHYSICS
- Grain growth and complex stress evolution during Volmer–Weber growth of polycrystalline thin films
- (2014) Hang Z. Yu et al. ACTA MATERIALIA
- Growth of patterned island arrays to identify origins of thin film stress
- (2014) E. Chason et al. JOURNAL OF APPLIED PHYSICS
- Atom insertion into grain boundaries and stress generation in physically vapor deposited films
- (2013) D. Magnfält et al. APPLIED PHYSICS LETTERS
- Understanding Residual Stress in Electrodeposited Cu Thin Films
- (2013) Eric Chason et al. JOURNAL OF THE ELECTROCHEMICAL SOCIETY
- Real-time stress evolution during early growth stages of sputter-deposited metal films: Influence of adatom mobility
- (2013) G. Abadias et al. VACUUM
- Kinetic model for dependence of thin film stress on growth rate, temperature, and microstructure
- (2012) E. Chason et al. JOURNAL OF APPLIED PHYSICS
- Intrinsic stress in ZrN thin films: Evaluation of grain boundary contribution from in situ wafer curvature and ex situ x-ray diffraction techniques
- (2012) L. E. Koutsokeras et al. JOURNAL OF APPLIED PHYSICS
- A kinetic analysis of residual stress evolution in polycrystalline thin films
- (2012) Eric Chason THIN SOLID FILMS
- Stress, phase stability and oxidation resistance of ternary Ti–Me–N (Me=Zr, Ta) hard coatings
- (2012) G. Abadias et al. THIN SOLID FILMS
- Radiation-induced damage and evolution of defects in Mo
- (2011) Sergey V. Starikov et al. PHYSICAL REVIEW B
- Influence of Phase Transformation on Stress Evolution during Growth of Metal Thin Films on Silicon
- (2010) A. Fillon et al. PHYSICAL REVIEW LETTERS
- Stress and microstructure evolution during growth of magnetron-sputtered low-mobility metal films: Influence of the nucleation conditions
- (2010) A. Fillon et al. THIN SOLID FILMS
- Understanding the relation between stress and surface morphology in sputtered films: Atomistic simulations and experiments
- (2009) Luis A. Zepeda-Ruiz et al. APPLIED PHYSICS LETTERS
- Compressive Stress Generation in Sn Thin Films and the Role of Grain Boundary Diffusion
- (2009) Jae Wook Shin et al. PHYSICAL REVIEW LETTERS
- Direct Evidence for Effects of Grain Structure on Reversible Compressive Deposition Stresses in Polycrystalline Gold Films
- (2009) J. Leib et al. PHYSICAL REVIEW LETTERS
- Stress in Evaporated and Sputtered Thin Films – A Comparison
- (2009) R. Koch SURFACE & COATINGS TECHNOLOGY
- High power pulsed magnetron sputtering: A review on scientific and engineering state of the art
- (2009) K. Sarakinos et al. SURFACE & COATINGS TECHNOLOGY
- In situ stress evolution during magnetron sputtering of transition metal nitride thin films
- (2008) G. Abadias et al. APPLIED PHYSICS LETTERS
- The metal flux from a rotating cylindrical magnetron: a Monte Carlo simulation
- (2008) K Van Aeken et al. JOURNAL OF PHYSICS D-APPLIED PHYSICS
Create your own webinar
Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.
Create NowAsk a Question. Answer a Question.
Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.
Get Started