4.5 Article

N-type conduction of sputter-deposited polycrystalline Al0.78Sc0.22N films by Si ion implantation

Journal

APPLIED PHYSICS EXPRESS
Volume 14, Issue 2, Pages -

Publisher

IOP PUBLISHING LTD
DOI: 10.35848/1882-0786/abd6a0

Keywords

AlScN; ferroelectric; n-type conduction; Si ion implantation

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The N-type conduction of sputter-deposited polycrystalline Al0.78Sc0.22N films was confirmed by Si ion implantation and activation annealing. However, the film surface is sensitive to humidity, leading to a significant increase in sheet resistance.
N-type conduction of sputter-deposited polycrystalline Al0.78Sc0.22N films was verified by Si ion implantation followed by activation annealing. The activation of dopants was found above an annealing temperature of 800 degrees C. Under a dose of 2 x 10(15) cm(-2) with an activation annealing at 900 degrees C, n-type conduction was obtained with Hall mobility and a carrier concentration of 8.6 cm(2) V-1 s(-1) and 8.9 x 10(18) cm(-3), respectively. The surface of n-type Al0.78Sc0.22N films was sensitive to humidity, and two orders of magnitude increase in the sheet resistance were measured. The phenomena can be understood by the formation of depletion from the backside of the film, caused by the balance between the spontaneous polarization and the surface charges. (c) 2021 The Japan Society of Applied Physics

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