Atomic scale confirmation of ferroelectric polarization inversion in wurtzite-type AlScN
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Title
Atomic scale confirmation of ferroelectric polarization inversion in wurtzite-type AlScN
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 129, Issue 3, Pages 034103
Publisher
AIP Publishing
Online
2021-01-15
DOI
10.1063/5.0033205
References
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Related references
Note: Only part of the references are listed.- AlScN: A III-V semiconductor based ferroelectric
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- Identifying and overcoming the interface originating c-axis instability in highly Sc enhanced AlN for piezoelectric micro-electromechanical systems
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- Giant linear strain gradient with extremely low elastic energy in a perovskite nanostructure array
- (2017) Y. L. Tang et al. Nature Communications
- The impact of argon admixture on the c-axis oriented growth of direct current magnetron sputtered ScxAl1−xN thin films
- (2014) P. M. Mayrhofer et al. JOURNAL OF APPLIED PHYSICS
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- (2013) Siyuan Zhang et al. JOURNAL OF APPLIED PHYSICS
- Strong strain dependence of ferroelectric coercivity in a BiFeO3 film
- (2011) M. D. Biegalski et al. APPLIED PHYSICS LETTERS
- Flexoelectric rotation of polarization in ferroelectric thin films
- (2011) G. Catalan et al. NATURE MATERIALS
- “Cube-on-hexagon” orientation relationship for Fe onGaN(0001¯): The missing link in bcc/hcp epitaxy
- (2010) Cunxu Gao et al. PHYSICAL REVIEW B
- Origin of the Anomalous Piezoelectric Response in WurtziteScxAl1−xNAlloys
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- Improvement in crystal orientation of AlN thin films prepared on Mo electrodes using AlN interlayers
- (2007) Toshihiro Kamohara et al. CERAMICS INTERNATIONAL
- Epitaxial growth of AlN on single crystal Mo substrates
- (2007) Koichiro Okamoto et al. THIN SOLID FILMS
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