Thickness- and orientation- dependences of Curie temperature in ferroelectric epitaxial Y doped HfO2 films

Title
Thickness- and orientation- dependences of Curie temperature in ferroelectric epitaxial Y doped HfO2 films
Authors
Keywords
-
Journal
JAPANESE JOURNAL OF APPLIED PHYSICS
Volume 59, Issue SG, Pages SGGB04
Publisher
IOP Publishing
Online
2020-02-20
DOI
10.35848/1347-4065/ab6d84

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