In situ X-ray diffraction study of the controlled oxidation and reduction in the V–O system for the synthesis of VO2 and V2O3 thin films
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Title
In situ X-ray diffraction study of the controlled oxidation and reduction in the V–O system for the synthesis of VO2 and V2O3 thin films
Authors
Keywords
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Journal
Journal of Materials Chemistry C
Volume 3, Issue 43, Pages 11357-11365
Publisher
Royal Society of Chemistry (RSC)
Online
2015-09-23
DOI
10.1039/c5tc02553b
References
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