In-situ X-ray Diffraction study of Metal Induced Crystallization of amorphous silicon

Published 2007 View Full Article

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Title
In-situ X-ray Diffraction study of Metal Induced Crystallization of amorphous silicon
Authors
Keywords
-
Journal
THIN SOLID FILMS
Volume 516, Issue 15, Pages 4946-4952
Publisher
Elsevier BV
Online
2007-10-02
DOI
10.1016/j.tsf.2007.09.037

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