In situ X-ray diffraction study of the controlled oxidation and reduction in the V–O system for the synthesis of VO2 and V2O3 thin films

标题
In situ X-ray diffraction study of the controlled oxidation and reduction in the V–O system for the synthesis of VO2 and V2O3 thin films
作者
关键词
-
出版物
Journal of Materials Chemistry C
Volume 3, Issue 43, Pages 11357-11365
出版商
Royal Society of Chemistry (RSC)
发表日期
2015-09-23
DOI
10.1039/c5tc02553b

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