Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse Spectroscopy
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Title
Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse Spectroscopy
Authors
Keywords
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Journal
Scientific Reports
Volume 5, Issue -, Pages 14902
Publisher
Springer Nature
Online
2015-10-08
DOI
10.1038/srep14902
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