Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse Spectroscopy
出版年份 2015 全文链接
标题
Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse Spectroscopy
作者
关键词
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出版物
Scientific Reports
Volume 5, Issue -, Pages 14902
出版商
Springer Nature
发表日期
2015-10-08
DOI
10.1038/srep14902
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