A thermalization energy analysis of the threshold voltage shift in amorphous indium gallium zinc oxide thin film transistors under simultaneous negative gate bias and illumination

Temperature dependence of negative bias under illumination stress and recovery in amorphous indium gallium zinc oxide thin film transistors

(2013) Md Delwar Hossain Chowdhury et al.   APPLIED PHYSICS LETTERS

Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances

(2012) E. Fortunato et al.   ADVANCED MATERIALS

Effects of Diffusion of Hydrogen and Oxygen on Electrical Properties of Amorphous Oxide Semiconductor, In-Ga-Zn-O

(2012) Kenji Nomura et al.   ECS Journal of Solid State Science and Technology

Trap-limited and percolation conduction mechanisms in amorphous oxide semiconductor thin film transistors

(2011) Sungsik Lee et al.   APPLIED PHYSICS LETTERS

Crystalline In–Ga–Zn–O Density of States and Energy Band Structure Calculation Using Density Function Theory

(2011) Charlene Chen et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Properties and doping limits of amorphous oxide semiconductors

(2011) John Robertson   JOURNAL OF NON-CRYSTALLINE SOLIDS

Bias-Stress-Stable Solution-Processed Oxide Thin Film Transistors

(2010) Youngmin Jeong et al.   ACS Applied Materials & Interfaces

O-vacancy as the origin of negative bias illumination stress instability in amorphous In–Ga–Zn–O thin film transistors

(2010) Byungki Ryu et al.   APPLIED PHYSICS LETTERS

Origin of definite Hall voltage and positive slope in mobility-donor density relation in disordered oxide semiconductors

(2010) Toshio Kamiya et al.   APPLIED PHYSICS LETTERS

Materials and Applications for Large Area Electronics: Solution-Based Approaches

(2010) Ana Claudia Arias et al.   CHEMICAL REVIEWS

Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors

(2010) John F. Conley   IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

Metastability in multicomponent oxide transistors

(2010) Warren B. Jackson et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE

Ab initiomodeling of diffusion in indium oxide

(2010) Péter Ágoston et al.   PHYSICAL REVIEW B

Intrinsic defects in ZnO calculated by screened exchange and hybrid density functionals

(2010) S. J. Clark et al.   PHYSICAL REVIEW B

Origins of threshold voltage shifts in room-temperature deposited and annealed a-In–Ga–Zn–O thin-film transistors

(2009) Kenji Nomura et al.   APPLIED PHYSICS LETTERS

Two-dimensional numerical simulation of radio frequency sputter amorphous In–Ga–Zn–O thin-film transistors

(2009) Tze-Ching Fung et al.   JOURNAL OF APPLIED PHYSICS

Comprehensive studies on the stabilities of a-In-Ga-Zn-O based thin film transistor by constant current stress

(2009) Kenji Nomura et al.   THIN SOLID FILMS

Disorder and instability processes in amorphous conducting oxides

(2008) John Robertson   PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS

Defect energetics in ZnO: A hybrid Hartree-Fock density functional study

(2008) Fumiyasu Oba et al.   PHYSICAL REVIEW B

Assessment of correction methods for the band-gap problem and for finite-size effects in supercell defect calculations: Case studies for ZnO and GaAs

(2008) Stephan Lany et al.   PHYSICAL REVIEW B