Analytical Field-Effect Method for Extraction of Subgap States in Thin-Film Transistors

Authors

Keywords

Journal

Volume 33, Issue 7, Pages 1006-1008

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2012-06-23

DOI

10.1109/led.2012.2193657

References

View 3 related references

Explore over 38,000 international journals covering a vast array of academic fields.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started