Recent development of studies on the mechanism of resistive memories in several metal oxides

Title
Recent development of studies on the mechanism of resistive memories in several metal oxides
Authors
Keywords
resistive switching effect, valence change memory, electrode engineering, <em class=EmphasisTypeItalic >in</em>-<em class=EmphasisTypeItalic >situ</em> TEM
Journal
Science China-Physics Mechanics & Astronomy
Volume 56, Issue 12, Pages 2361-2369
Publisher
Springer Nature
Online
2013-11-16
DOI
10.1007/s11433-013-5341-9

Ask authors/readers for more resources

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started