Recent development of studies on the mechanism of resistive memories in several metal oxides
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Title
Recent development of studies on the mechanism of resistive memories in several metal oxides
Authors
Keywords
resistive switching effect, valence change memory, electrode engineering, <em class=EmphasisTypeItalic >in</em>-<em class=EmphasisTypeItalic >situ</em> TEM
Journal
Science China-Physics Mechanics & Astronomy
Volume 56, Issue 12, Pages 2361-2369
Publisher
Springer Nature
Online
2013-11-16
DOI
10.1007/s11433-013-5341-9
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