In situ TEM studies of oxygen vacancy migration for electrically induced resistance change effect in cerium oxides

Published 2009 View Full Article

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Title
In situ TEM studies of oxygen vacancy migration for electrically induced resistance change effect in cerium oxides
Authors
Keywords
-
Journal
MICRON
Volume 41, Issue 4, Pages 301-305
Publisher
Elsevier BV
Online
2009-12-07
DOI
10.1016/j.micron.2009.11.010

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