Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications
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Title
Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications
Authors
Keywords
Zinc, Semiconductors, Copper, Electronic properties, Electrostatics, Oxygen, Atomic force microscopy, Chemical vapor deposition
Journal
PLoS One
Volume 12, Issue 1, Pages e0171050
Publisher
Public Library of Science (PLoS)
Online
2017-01-31
DOI
10.1371/journal.pone.0171050
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