Quantifying charge carrier concentration in ZnO thin films by Scanning Kelvin Probe Microscopy
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Title
Quantifying charge carrier concentration in ZnO thin films by Scanning Kelvin Probe Microscopy
Authors
Keywords
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Journal
Scientific Reports
Volume 4, Issue 1, Pages -
Publisher
Springer Nature
Online
2014-02-26
DOI
10.1038/srep04203
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