Strain and lattice orientation distribution in SiN/Ge complementary metal–oxide–semiconductor compatible light emitting microstructures by quick x-ray nano-diffraction microscopy
Published 2015 View Full Article
- Home
- Publications
- Publication Search
- Publication Details
Title
Strain and lattice orientation distribution in SiN/Ge complementary metal–oxide–semiconductor compatible light emitting microstructures by quick x-ray nano-diffraction microscopy
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 106, Issue 7, Pages 071902
Publisher
AIP Publishing
Online
2015-02-19
DOI
10.1063/1.4909529
References
Ask authors/readers for more resources
Related references
Note: Only part of the references are listed.- Tensile Ge microstructures for lasing fabricated by means of a silicon complementary metal-oxide-semiconductor process
- (2014) G. Capellini et al. OPTICS EXPRESS
- Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping
- (2014) Gilbert André Chahine et al. JOURNAL OF APPLIED CRYSTALLOGRAPHY
- Strain analysis in SiN/Ge microstructures obtained via Si-complementary metal oxide semiconductor compatible approach
- (2013) G. Capellini et al. JOURNAL OF APPLIED PHYSICS
- Analysis of enhanced light emission from highly strained germanium microbridges
- (2013) M. J. Süess et al. Nature Photonics
- Radiative recombination and optical gain spectra in biaxially strainedn-type germanium
- (2013) M. Virgilio et al. PHYSICAL REVIEW B
- Perfect crystals grown from imperfect interfaces
- (2013) Claudiu V. Falub et al. Scientific Reports
- Nanoscale Distortions of Si Quantum Wells in Si/SiGe Quantum-Electronic Heterostructures
- (2012) P. G. Evans et al. ADVANCED MATERIALS
- Control of tensile strain in germanium waveguides through silicon nitride layers
- (2012) A. Ghrib et al. APPLIED PHYSICS LETTERS
- High temperature x ray diffraction measurements on Ge/Si(001) heterostructures: A study on the residual tensile strain
- (2012) G. Capellini et al. JOURNAL OF APPLIED PHYSICS
- A micromachining-based technology for enhancing germanium light emission via tensile strain
- (2012) Jinendra Raja Jain et al. Nature Photonics
- An electrically pumped germanium laser
- (2012) Rodolfo E. Camacho-Aguilera et al. OPTICS EXPRESS
- Roadmap to an Efficient Germanium-on-Silicon Laser: Strain vs. n-Type Doping
- (2012) Birendra Dutt et al. IEEE Photonics Journal
- MAXIPIX, a fast readout photon-counting X-ray area detector for synchrotron applications
- (2011) C Ponchut et al. Journal of Instrumentation
- Optical gain in single tensile-strained germanium photonic wire
- (2011) M. de Kersauson et al. OPTICS EXPRESS
- Direct-bandgap light-emitting germanium in tensilely strained nanomembranes
- (2011) J. R. Sanchez-Perez et al. PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA
- Low threading dislocation density Ge deposited on Si (100) using RPCVD
- (2011) Yuji Yamamoto et al. SOLID-STATE ELECTRONICS
- Low threading dislocation Ge on Si by combining deposition and etching
- (2011) Yuji Yamamoto et al. THIN SOLID FILMS
- Recent progress in lasers on silicon
- (2010) Di Liang et al. Nature Photonics
- Prediction that Uniaxial Tension along⟨111⟩Produces a Direct Band Gap in Germanium
- (2009) Feng Zhang et al. PHYSICAL REVIEW LETTERS
Add your recorded webinar
Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.
Upload NowBecome a Peeref-certified reviewer
The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.
Get Started