Imaging of strain and lattice orientation by quick scanning X-ray microscopy combined with three-dimensional reciprocal space mapping

xrayutilities: a versatile tool for reciprocal space conversion of scattering data recorded with linear and area detectors

(2013) Dominik Kriegner et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Strain analysis in SiN/Ge microstructures obtained via Si-complementary metal oxide semiconductor compatible approach

(2013) G. Capellini et al.   JOURNAL OF APPLIED PHYSICS

Counting Dislocations in Microcrystals by Coherent X-Ray Diffraction

(2013) V. L. R. Jacques et al.   PHYSICAL REVIEW LETTERS

Perfect crystals grown from imperfect interfaces

(2013) Claudiu V. Falub et al.   Scientific Reports

Scanning X-ray strain microscopy of inhomogeneously strained Ge micro-bridges

(2013) Tanja Etzelstorfer et al.   JOURNAL OF SYNCHROTRON RADIATION

Nanoscale Distortions of Si Quantum Wells in Si/SiGe Quantum-Electronic Heterostructures

(2012) P. G. Evans et al.   ADVANCED MATERIALS

Compliant substrate versus plastic relaxation effects in Ge nanoheteroepitaxy on free-standing Si(001) nanopillars

(2011) G. Kozlowski et al.   APPLIED PHYSICS LETTERS

MAXIPIX, a fast readout photon-counting X-ray area detector for synchrotron applications

(2011) C Ponchut et al.   Journal of Instrumentation

Coherent diffraction imaging of a single epitaxial InAs nanowire using a focused x-ray beam

(2009) A. Diaz et al.   PHYSICAL REVIEW B

Beyond the ensemble average: X-ray microdiffraction analysis of single SiGe islands

(2008) C. Mocuta et al.   PHYSICAL REVIEW B