Distinction between silicon and oxide traps using single-trap spectroscopy

Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics

(2014) S.D. dos Santos et al.   SOLID-STATE ELECTRONICS

Analysis of Random Telegraph Noise in 45-nm CMOS Using On-Chip Characterization System

(2013) Simeon Realov et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Low-Frequency Noise Studies on Fully Depleted UTBOX Silicon-on-Insulator nMOSFETs: Challenges and Opportunities

(2013) E. Simoen et al.   ECS Journal of Solid State Science and Technology

Junction Field Effect on the Retention Time for One-Transistor Floating-Body RAM

(2012) Marc Aoulaiche et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Dependence of Generation–Recombination Noise With Gate Voltage in FD SOI MOSFETs

(2012) Abraham Luque Rodriguez et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

On the Variability of the Front-/Back-Channel LF Noise in UTBOX SOI nMOSFETs

(2012) Sara D. dos Santos et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Low-Frequency Noise Investigation and Noise Variability Analysis in High- $k$/Metal Gate 32-nm CMOS Transistors

(2011) Diana Lopez et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Comprehensive Analysis of Random Telegraph Noise Instability and Its Scaling in Deca–Nanometer Flash Memories

(2009) Andrea Ghetti et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES