Analysis of Random Telegraph Noise in 45-nm CMOS Using On-Chip Characterization System

Authors

Keywords

Journal

Volume 60, Issue 5, Pages 1716-1722

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2013-04-16

DOI

10.1109/ted.2013.2254118

References

View 3 related references

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started