On the Variability of the Front-/Back-Channel LF Noise in UTBOX SOI nMOSFETs

Title
On the Variability of the Front-/Back-Channel LF Noise in UTBOX SOI nMOSFETs
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 60, Issue 1, Pages 444-450
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2012-12-01
DOI
10.1109/ted.2012.2227749

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