Low-Frequency Noise Investigation and Noise Variability Analysis in High- $k$/Metal Gate 32-nm CMOS Transistors

Published 2011 View Full Article

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Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Volume 58, Issue 8, Pages 2310-2316

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2011-05-27

DOI

10.1109/ted.2011.2141139

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