Effect of reset voltage polarity on the resistive switching region of unipolar memory

Oxygen-concentration effect on p-type CuAlOx resistive switching behaviors and the nature of conducting filaments

(2014) L. Zhang et al.   APPLIED PHYSICS LETTERS

Characteristics of gadolinium oxide resistive switching memory with Pt–Al alloy top electrode and post-metallization annealing

(2013) Jer-Chyi Wang et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Dynamic Evolution of Conducting Nanofilament in Resistive Switching Memories

(2013) Jui-Yuan Chen et al.   NANO LETTERS

Resistive switching characteristics of nickel silicide layer embedded HfO2 film

(2012) Debashis Panda et al.   APPLIED PHYSICS LETTERS

Reset Instability in $\hbox{Cu}/\hbox{ZrO}_{2}$:Cu/Pt RRAM Device

(2011) Yingtao Li et al.   IEEE ELECTRON DEVICE LETTERS

Flexible Resistive Switching Memory Device Based on Amorphous InGaZnO Film With Excellent Mechanical Endurance

(2011) Z. Q. Wang et al.   IEEE ELECTRON DEVICE LETTERS

Scaling analysis of submicrometer nickel-oxide-based resistive switching memory devices

(2011) D. Ielmini et al.   JOURNAL OF APPLIED PHYSICS

Physical models of size-dependent nanofilament formation and rupture in NiO resistive switching memories

(2011) D Ielmini et al.   NANOTECHNOLOGY

Bipolar Resistive Switching Characteristics of Transparent Indium Gallium Zinc Oxide Resistive Random Access Memory

(2010) Min-Chen Chen et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Effects of compliance currents on the formation and rupture of conducting filaments in unipolar resistive switching of CoO film

(2010) Z Q Wang et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Atomic structure of conducting nanofilaments in TiO2 resistive switching memory

(2010) Deok-Hwang Kwon et al.   Nature Nanotechnology

Endurance enhancement of Cu-oxide based resistive switching memory with Al top electrode

(2009) Hangbing Lv et al.   APPLIED PHYSICS LETTERS

Unipolar resistive switching characteristics of room temperature grown SnO2 thin films

(2009) Kazuki Nagashima et al.   APPLIED PHYSICS LETTERS

Effects of metal electrodes on the resistive memory switching property of NiO thin films

(2008) C. B. Lee et al.   APPLIED PHYSICS LETTERS

Addressing Cu/Low-$k$ Dielectric TDDB-Reliability Challenges for Advanced CMOS Technologies

(2008) Fen Chen et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES