Structure and refractive index of thin alumina films grown by atomic layer deposition

Title
Structure and refractive index of thin alumina films grown by atomic layer deposition
Authors
Keywords
Atomic Layer Deposition, Spectroscopic Ellipsometry, Deposition Cycle, Al2O3 Film, Alumina Thin Film
Journal
Publisher
Springer Nature
Online
2014-06-26
DOI
10.1007/s10854-014-2111-z

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