Structure and refractive index of thin alumina films grown by atomic layer deposition

标题
Structure and refractive index of thin alumina films grown by atomic layer deposition
作者
关键词
Atomic Layer Deposition, Spectroscopic Ellipsometry, Deposition Cycle, Al2O3 Film, Alumina Thin Film
出版物
出版商
Springer Nature
发表日期
2014-06-26
DOI
10.1007/s10854-014-2111-z

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