A study of lateral Schottky contacts in WSe2 and MoS2 field effect transistors using scanning photocurrent microscopy

Title
A study of lateral Schottky contacts in WSe2 and MoS2 field effect transistors using scanning photocurrent microscopy
Authors
Keywords
-
Journal
Nanoscale
Volume 7, Issue 38, Pages 15711-15718
Publisher
Royal Society of Chemistry (RSC)
Online
2015-08-24
DOI
10.1039/c5nr04592d

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