Performance and Reliability of ${\rm Gd}_{2}{\rm O}_{3}$ and Stacked ${\rm Gd}_{2}{\rm O}_{3}\hbox{-}{\rm Eu}_{2}{\rm O}_{3}$ Metal-Insulator-Metal Capacitors

High-Performance Metal–Insulator–Metal Capacitors Using Europium Oxide as Dielectric

(2012) Revathy Padmanabhan et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

High-Performance $\hbox{Ni}/\hbox{Lu}_{2}\hbox{O}_{3}/ \hbox{TaN}$ Metal–Insulator–Metal Capacitors

(2011) Somnath Mondal et al.   IEEE ELECTRON DEVICE LETTERS

Trap-assisted conduction in Pt-gated Gd2O3/Si capacitors

(2011) E. Lipp et al.   JOURNAL OF APPLIED PHYSICS

HfO2, Sr-Ta-O and Ti-Ta-O High-k Dielectrics for Metal-Insulator-Metal Applications

(2011) M. Lukosius et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Electrode oxygen-affinity influence on voltage nonlinearities in high-k metal-insulator-metal capacitors

(2010) C. Vallée et al.   APPLIED PHYSICS LETTERS

High-Performance Metal–Insulator–Metal Capacitors With $\hbox{HfTiO}/\hbox{Y}_{2}\hbox{O}_{3}$ Stacked Dielectric

(2010) Bing-Yue Tsui et al.   IEEE ELECTRON DEVICE LETTERS

High-Density MIM Capacitors With Porous Anodic Alumina Dielectric

(2010) E. Hourdakis et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Preparation and characterization of TaAlOx high-κ dielectric for metal–insulator–metal capacitor applications

(2010) M.K. Hota et al.   THIN SOLID FILMS

Characteristics of Cerium Oxide for Metal–Insulator–Metal Capacitors

(2009) C. H. Cheng et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Physical and Electrical Characterization of Metal–Insulator–Metal Capacitors With $\hbox{Sm}_{2}\hbox{O}_{3}$ and $\hbox{Sm}_{2}\hbox{O}_{3}/\hbox{SiO}_{2}$ Laminated Dielectrics for Analog Circuit Applications

(2009) Jing-De Chen et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

High performance TaYOx-based MIM capacitors

(2009) C. Mahata et al.   MICROELECTRONIC ENGINEERING

High Density and Low Leakage Current in $ \hbox{TiO}_{2}$ MIM Capacitors Processed at 300 $^{\circ} \hbox{C}$

(2008) C. H. Cheng et al.   IEEE ELECTRON DEVICE LETTERS

The role of carbon contamination in voltage linearity and leakage current in high-k metal-insulator-metal capacitors

(2008) Bing Miao et al.   JOURNAL OF APPLIED PHYSICS