The Study of Self-Heating and Hot-Electron Effects for AlGaN/GaN Double-Channel HEMTs
Published 2012 View Full Article
- Home
- Publications
- Publication Search
- Publication Details
Title
The Study of Self-Heating and Hot-Electron Effects for AlGaN/GaN Double-Channel HEMTs
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 59, Issue 5, Pages 1393-1401
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2012-03-20
DOI
10.1109/ted.2012.2188634
References
Ask authors/readers for more resources
Related references
Note: Only part of the references are listed.- The plasmonic resonant absorption in GaN double-channel high electron mobility transistors
- (2011) Lin Wang et al. APPLIED PHYSICS LETTERS
- Fabrication and Characterization of Thin-Barrier $ \hbox{Al}_{0.5}\hbox{Ga}_{0.5}\hbox{N/AlN/GaN}$ HEMTs
- (2011) Jonathan G. Felbinger et al. IEEE ELECTRON DEVICE LETTERS
- Effects of Barrier Thinning on Small-Signal and 30-GHz Power Characteristics of AlGaN/GaN Heterostructure Field-Effect Transistors
- (2011) Masataka Higashiwaki et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Transport Studies of AlGaN/GaN Heterostructures of Different Al Mole Fractions With Variable $\hbox{SiN}_{x}$ Passivation Stress
- (2011) Tamara B. Fehlberg et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Investigation of Trapping and Hot-Electron Effects in GaN HEMTs by Means of a Combined Electrooptical Method
- (2011) Matteo Meneghini et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Two-Stage High-Gain High-Power Distributed Amplifier Using Dual-Gate GaN HEMTs
- (2011) Rajkumar Santhakumar et al. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
- Dependence of dark current and photoresponse characteristics on polarization charge density for GaN-based avalanche photodiodes
- (2011) Xiaodong Wang et al. JOURNAL OF PHYSICS D-APPLIED PHYSICS
- Reduced thermal resistance of the silicon-synthetic diamond composite substrates at elevated temperatures
- (2010) V. Goyal et al. APPLIED PHYSICS LETTERS
- N-Polar GaN/AlN MIS-HEMT for Ka-Band Power Applications
- (2010) Nidhi et al. IEEE ELECTRON DEVICE LETTERS
- 205-GHz (Al,In)N/GaN HEMTs
- (2010) Haifeng Sun et al. IEEE ELECTRON DEVICE LETTERS
- Self-Aligned Technology for N-Polar GaN/Al(Ga)N MIS-HEMTs
- (2010) Nidhi et al. IEEE ELECTRON DEVICE LETTERS
- The role of ultrathin AlN barrier in the reduction in the hot electron and self-heating effects for GaN-based double-heterojunction high electron mobility transistors
- (2010) L. Wang et al. JOURNAL OF APPLIED PHYSICS
- Effects of Threading Dislocations on AlGaN/GaN High-Electron Mobility Transistors
- (2009) Fabio Alessio Marino et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Deep-Ultraviolet Light-Emitting Diodes
- (2009) Michael S. Shur et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Analysis of degradation mechanisms in lattice-matched InAlN/GaN high-electron-mobility transistors
- (2009) J. Kuzmik et al. JOURNAL OF APPLIED PHYSICS
- Very high channel conductivity in low-defect AlN/GaN high electron mobility transistor structures
- (2008) A. M. Dabiran et al. APPLIED PHYSICS LETTERS
- Low-frequency noise properties of double channel AlGaN/GaN HEMTs
- (2007) S.K. Jha et al. SOLID-STATE ELECTRONICS
Find Funding. Review Successful Grants.
Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.
ExploreCreate your own webinar
Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.
Create Now