Electrical Characterization of Gate Traps in FETs With Ge and III–V Channels
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Title
Electrical Characterization of Gate Traps in FETs With Ge and III–V Channels
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Volume 13, Issue 4, Pages 463-479
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2013-08-08
DOI
10.1109/tdmr.2013.2276755
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