The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps

Published 2011 View Full Article

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Title
The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 58, Issue 11, Pages 3652-3666
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2011-10-05
DOI
10.1109/ted.2011.2164543

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