The impact of interfacial Si contamination on GaN-on-GaN regrowth for high power vertical devices
出版年份 2021 全文链接
标题
The impact of interfacial Si contamination on GaN-on-GaN regrowth for high power vertical devices
作者
关键词
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出版物
APPLIED PHYSICS LETTERS
Volume 118, Issue 22, Pages 222104
出版商
AIP Publishing
发表日期
2021-06-02
DOI
10.1063/5.0049473
参考文献
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