X-ray Diffraction Line Profile Analysis of Undoped and Se-Doped SnS Thin Films Using Scherrer’s, Williamson–Hall and Size–Strain Plot Methods
出版年份 2018 全文链接
标题
X-ray Diffraction Line Profile Analysis of Undoped and Se-Doped SnS Thin Films Using Scherrer’s, Williamson–Hall and Size–Strain Plot Methods
作者
关键词
Line profile analysis, Se-doped SnS, Williamson–Hall method, size–strain plot method, thin films
出版物
JOURNAL OF ELECTRONIC MATERIALS
Volume 48, Issue 2, Pages 1294-1309
出版商
Springer Nature
发表日期
2018-11-20
DOI
10.1007/s11664-018-6791-7
参考文献
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