期刊
ACTA MATERIALIA
卷 78, 期 -, 页码 46-55出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.actamat.2014.06.008
关键词
Polycrystal; Coherent X-ray diffraction; Strain; Phase retrieval
Coherent X-ray diffraction is able to yield non-destructively 3-D strain maps with unprecedented resolution in small isolated crystals. In this work we have used this technique to investigate the mechanical behavior of a single grain within a Au polycrystalline film. The 111 Bragg reflection from a 1250 x 950 x 475 nm single grain has been successfully measured in three dimensions during thermomechanical loading. From these 3-D reciprocal space maps the displacement field is obtained through a specific phase-retrieval procedure. The u(z)(x, y, z) component of the displacement field component is deduced as a function of temperature with a high spatial resolution of 17 x 17 x 22 nm within the single grain. This displacement field is discussed with respect to grain-to-grain interactions in the supported metal film. This study opens important perspectives for the evaluation of mechanical properties of polycrystals via coherent X-ray diffraction. (C) 2014 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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