期刊
SCRIPTA MATERIALIA
卷 143, 期 -, 页码 49-53出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.scriptamat.2017.09.005
关键词
Polychromatic X-ray Laue microdiffraction; Orientation mapping; Phase distribution; Plastic deformation
类别
资金
- National Natural Science Foundation of China [51671154, 51405507]
- National Key Research and Development Program of China [2016YFB0700404]
- National Basic Research Program of China (973 Program) [2015CB057400]
- Fundamental Research Funds for the Central Universities [2015gjhz03]
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies
- Collaborative Innovation Center of High-End Manufacturing Equipment
- Office of Science, Office of Basic Energy Sciences, Materials Science Division, of the U.S. Department of Energy at LBNL [DE-AC02-05CH11231]
Indexing Laue patterns of a synchrotron microdiffraction scan can take as much as ten times longer than collecting the data, impeding efficient structural analysis using this technique. Here a novel strategy is developed. By comparing the peak positions of adjacent Laue patterns and checking the intensity sequence, grain and phase boundaries are identified, requiring only a limited number of indexing steps for each individual grain. Using this protocol, the Laue patterns can be indexed on the fly as they are taken. The validation of this method is demonstrated by analyzing the microstructure of a laser 3D printed multi-phase/multi-grain Ni-based superalloy. (C) 2017 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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