期刊
THIN SOLID FILMS
卷 603, 期 -, 页码 29-33出版社
ELSEVIER SCIENCE SA
DOI: 10.1016/j.tsf.2016.01.045
关键词
Piezoeffect; X-ray diffraction; Thin film; Anisotropy; In-situ experiment
类别
资金
- CAPES-COFECUB [801-14]
- CNPq [305973/2012-6, 400677/2014-8]
- FAPESP [2010/16504-0]
- Fundacao de Amparo a Pesquisa do Estado de Sao Paulo (FAPESP) [10/16504-0] Funding Source: FAPESP
Piezoelectric properties of randomly oriented self-polarized PbZr0.50Ti0.50O3 (PZT) thin films were investigated using in situ synchrotron X-ray diffraction. Possibilities for investigating the piezoelectric effect using microsized hard X-ray beams are demonstrated and perspectives for future dynamical measurements on PZT samples with variety of compositions and thicknesses are given. Studies performed on the crystalline [100, 110] directions evidenced piezoelectric anisotropy. The piezoelectric coefficient d(33) was calculated in terms of the lab reference frame (d(perp)) and found to be two times larger along the [100] direction than along the [110] direction. The absolute values for the d(perp) amount to 120 and 230 pm/V being in good agreement with experimental and theoretical values found in literature for bulk PZT ceramics. (C) 2016 Elsevier B.V. All rights reserved.
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