Comparative study of a-IGZO TFTs with direct current and radio frequency sputtered channel layers

Mechanism of positive bias stress-assisted recovery in amorphous-indium-gallium-zinc-oxide thin-film transistors from negative bias under illumination stress

(2013) Jae Gwang Um et al.   APPLIED PHYSICS LETTERS

Effect of ${\rm O}_{2}$ Flow Rate During Channel Layer Deposition on Negative Gate Bias Stress-Induced $V_{\rm th}$ Shift of a-IGZO TFTs

(2013) Xiang Xiao et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Solution-processed indium gallium zinc oxide thin-film transistors with infrared irradiation annealing

(2013) Haifeng Pu et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Effect of Exposure to Ultraviolet-Activated Oxygen on the Electrical Characteristics of Amorphous Indium Gallium Zinc Oxide Thin Film Transistors

(2013) P. Liu et al.   ECS Solid State Letters

Effects of excess oxygen on operation characteristics of amorphous In-Ga-Zn-O thin-film transistors

(2011) Keisuke Ide et al.   APPLIED PHYSICS LETTERS

Review paper: Transparent amorphous oxide semiconductor thin film transistor

(2011) Jang-Yeon Kwon et al.   Electronic Materials Letters

Oxygen-Dependent Instability and Annealing/Passivation Effects in Amorphous In–Ga–Zn–O Thin-Film Transistors

(2011) Wei-Tsung Chen et al.   IEEE ELECTRON DEVICE LETTERS

Self-Aligned Coplanar a-IGZO TFTs and Application to High-Speed Circuits

(2011) Dong Han Kang et al.   IEEE ELECTRON DEVICE LETTERS

Review of recent developments in amorphous oxide semiconductor thin-film transistor devices

(2011) Joon Seok Park et al.   THIN SOLID FILMS

Instabilities in Amorphous Oxide Semiconductor Thin-Film Transistors

(2010) John F. Conley   IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

Present status of amorphous In–Ga–Zn–O thin-film transistors

(2010) Toshio Kamiya et al.   SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS

Constant-Voltage-Bias Stress Testing of a-IGZO Thin-Film Transistors

(2009) Ken Hoshino et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Performance and Stability Characterization of Bottom Gated Amorphous Indium Gallium Zinc Oxide Thin Film Transistors Grown by RF and DC Sputtering

(2009) Sung-Soo Park et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Materials, Devices, and Circuits of Transparent Amorphous-Oxide Semiconductor

(2009) Hideya Kumomi et al.   Journal of Display Technology

Origins of High Mobility and Low Operation Voltage of Amorphous Oxide TFTs: Electronic Structure, Electron Transport, Defects and Doping

(2009) T. Kamiya et al.   Journal of Display Technology

Modeling of amorphous InGaZnO4 thin film transistors and their subgap density of states

(2008) Hsing-Hung Hsieh et al.   APPLIED PHYSICS LETTERS

Electronic transport properties of amorphous indium-gallium-zinc oxide semiconductor upon exposure to water

(2008) Jin-Seong Park et al.   APPLIED PHYSICS LETTERS

Comprehensive Study on the Transport Mechanism of Amorphous Indium-Gallium-Zinc Oxide Transistors

(2008) Jae Kyeong Jeong et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY