High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation
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Title
High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation
Authors
Keywords
Digital image correlation (DIC), Stitching, External scan, Distortion, Alignment
Journal
EXPERIMENTAL MECHANICS
Volume -, Issue -, Pages -
Publisher
Springer Nature America, Inc
Online
2018-08-30
DOI
10.1007/s11340-018-0419-y
References
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